Figure 1

Electron microscopy images and elemental maps of the Fe(Se,Te) thin-film. (a) STEM cross-sectional image. (b) Corresponding SAED pattern. (c) Enlarged view of the Fe(Se,Te) film indicating high- and low-atomic mass grains. (d), (e) and (f) Corresponding EELS elemental maps of the portion indicated by a red dashed line in panel (c).