Figure 4
From: Spin–orbit torques in normal metal/Nb/ferromagnet heterostructures
XRD and TEM analysis of Nb thin films with the different buffer layers. (a–c) Peak signals of Nb thin films as a function of \({t}_{Nb}\) in (a) Si/SiO2/Nb \({t}_{Nb}\), (b) Si/SiO2/Ta 3/Nb \({t}_{Nb}\) and (c) Si/SiO2/Pt 3/Nb \({t}_{Nb}\) (\({t}_{Nb}\) = 3, 5, 7, 9, 15 nm) films, respectively. (d) Bragg mode scan with the angle range from 35° to 45° of the samples with the 15 nm of Nb layer. (e, f) TEM analysis of Ta 3/Nb 5 nm (e) and Pt 3/Nb 5 nm films (f) following annealing at 300 °C for 1 h. The inset of each figure shows the SAED image of Nb on the Ta and Pt underlayers.
