Figure 7

Long-term potentiation (LTP) and depression (LTD) characteristics of (a) single IGZO and (b) bi-layer IGZO/ZnO memristors. The applied positive/negative pulses were 50 for a single IGZO and 100 for bi-layer IGZO/ZnO memristors, respectively, and the current was read after each stimulation pulse was applied. The linearity and symmetricity of the LTP and LTD characteristics for bi-layer IGZO/ZnO memristor show more improved linearity than that for a single IGZO memristor.