Figure 2 | Scientific Reports

Figure 2

From: Effect of the substrate on the electrical transport and fluctuation processes in NbRe and NbReN ultrathin films for superconducting electronics applications

Figure 2

Electrical transport DC measurements. (a) Temperature dependence of the normalized resistance, \(R/R_{\mathrm {20K}}\), in the superconducting transition region. Blue and red circles refer to NbRe and NbReN films, respectively, while full and open symbols refer to 10-nm-thick (ultrathin) and 100-nm-thick (bulk) ones, respectively. (b) Temperature dependence of the normalized resistance, \(R/R_{\mathrm {20K}}\), in the normal state region for NbRe and NbReN 10-nm-thick films. Filled and open symbols refer to samples deposited on \(\text {SiO}_{{2}}\) and Si substrates, respectively.

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