Figure 3 | Scientific Reports

Figure 3

From: Sample-efficient parameter exploration of the powder film drying process using experiment-based Bayesian optimization

Figure 3

Prediction maps of the relationship between the temperature profiles during drying and defect ratios (a) before exploration, (b) after five experiments, and (c) after ten experiments of exploration. To visualize this, the second and third temperature profiles have been extracted and shown. Moreover, the uncertainty σ is shown by hatching. Since the prediction range of the defect ratio was not restricted, negative defect ratios are seen in (a), which can be interpreted as corresponding to parameter spaces where lower (closer to 0%) defect ratios are more likely to be obtained.

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