Figure 2

Contrast comparison between absorption and ZPC TXM. (a,b) Absorption images of the Cu sample from the selected images at pre-edge (8.960 keV) and post-edge (9.060 keV), respectively. (c,d) phase contrast images of the Cu sample from the selected images at pre-edge (8.960 keV) and post-edge (9.060 keV), respectively. Thin wedge Cu is clearly distinguishable in [(c,d) insets] from [(a,b) insets]. (e) Line profiles of dotted lines at (a) and (c), where the thickness of Cu were 300 nm and 50 nm. (f) X-ray refractive indices of Cu 100 nm at our scan window. The scale bars are 5 μm.