Figure 5
From: Quantified density of performance-degrading near-interface traps in SiC MOSFETs
(a) The density of trapped charge with response times longer than \({\tau }_{min}\)= 50 µs, 5 µs, and 500 ns for Manufacturer A; (b) the fraction of electrons trapped for longer than \({\tau }_{min}\), for Manufacturer A; (c) the density of trapped charge with response times longer than \({\tau }_{min}\)= 50 µs, 5 µs, and 500 ns for Manufacturer B (d) the fraction of electrons trapped for longer than \({\tau }_{min}\) for Manufacturer B.
