Figure 3
From: Complex drought patterns robustly explain global yield loss for major crops

Yearly crop susceptibility to drought-low yield association. Average global occurrence, for each year and cropping system, of SPEI duration-timing combinations with SPEI ≤ − 1 across all the occurrences of SYI ≤ − 1. Single points (some of which overlapping) represent each one year, the box limits indicate the 25th and 75th percentile while the internal horizontal line is the median. The whiskers represent the minimum and maximum after exclusion of outliers (i.e., values outside 1.5 times the interquartile range from the 25th and 75th percentile, respectively). Red line is the 2nd quantile among occurrence values assumed, as in Fig. 2, as the limit between Low and Medium susceptibility.