Figure 1 | Scientific Reports

Figure 1

From: The new X-ray/visible microscopy MAXWELL technique for fast three-dimensional nanoimaging with isotropic resolution

Figure 1

(a) Experimental setup of MAXWELL including a Wolter type-I linear focusing mirror that generates an X-ray nanoplane and a visible-light microscope system to detect the emission from X-ray-excited scintillating nanoparticles. (b) Knife edge intensity measurements performed at different positions along the optical axis. The measured thickness of the nanoplane was < 130 nm over the depth of focus of ± 175 µm. (c) A minimum FWHM size of 65 nm was observed at the focal spot.

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