Figure 6 | Scientific Reports

Figure 6

From: Scanning near-field optical spectroscopy and carrier transport based analysis in mesoscopic regions for two-dimensional semiconductors

Figure 6

Sliced the integral intensity map obtained from the C-mode operation. (a) Sliced every 21 meV map of the main emission energy range. (b) More finely (every 8 meV) sliced map within the range of change in the emission centre energy. (c) Slices of the three-dimensional emission centre wavelength map. Each slice of (b) and (c) has the same energy range.

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