Figure 8

Comparison of (a) J–V curves, (b) statistical distribution of the PCE, (c) EQE, and (d) Nyquist plot for the control and PEO-modified PSC devices. The inset in (d) is the equivalent circuit of the fit.

Comparison of (a) J–V curves, (b) statistical distribution of the PCE, (c) EQE, and (d) Nyquist plot for the control and PEO-modified PSC devices. The inset in (d) is the equivalent circuit of the fit.