Figure 2
Experimentally measured (a,b) and analytically calculated (c,d) optical and MO responses for Al2O3 (5 nm)/CoPt (t nm)/AZO (30 nm) trilayers in the polar Kerr excitation geometry. (b) Measured and (d) calculated Kerr activities (θK and θK) as a function of incident angle of radiation for samples containing 10.6- and 11.6-nm-thick CoPt layers, respectively. For the simulations at 658 nm, Table 1 lists the dielectric constants used for each layer.
