Figure 2 | Scientific Reports

Figure 2

From: Structural measurement of electron-phonon coupling and electronic thermal transport across a metal-semiconductor interface

Figure 2

(a) Si (004) rocking curve (black circle) and calculation result of dynamical diffraction theory (blue dashed and red solid lines based on the literature values for G and \(k_{e}\) and current work). The two temperature model for electron temperature (\(T_e\)) and lattice temperature (\(T_l\)) following laser excitation are shown for the literature values (b) and the current work (c). The calculated strain profiles for both the literature values (dashed blue) and current work (red solid) were solved at \(\Delta\)t = 5 ps (d) and at \(\Delta\)t = 0.34 ps (e).

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