Figure 2

High resolution TEM image of a thin cross-sectional lamella of FeGa (28 nm)/Kapton with low magnification (a) and high magnification (b). The HAADF and the elemental mapping of the layers are shown in (c). (d,e) Report the measured interplanar distances, which can be indexed as referring to the (110) crystal planes of \(\hbox {Fe}_{{70}}\) \(\hbox {Ga}_{{30}}\) and (110) crystal planes of \(\alpha\)-\(\hbox {Fe}_2\) \(\hbox {O}_3\).