Figure 4 | Scientific Reports

Figure 4

From: A spatial beam property analyzer based on dispersive crystal diffraction for low-emittance X-ray light sources

Figure 4

Images of (a) the flat beam without the Laue crystal and (b) the transmitted beam with the Laue crystal. (c) Measured (black curves) and ray-tracing simulated (blue curves) integrated 1D profiles of the flat beam, \(I_{\mathrm{flat}}(y)\) (dotted curves), and the transmitted beam, \(I_{\mathrm{trans}}(y)\) (solid curves). (d) Normalized transmission profiles from the experiment, \(I_{m} (y) = I_{\mathrm{trans}}(y)/I_{\mathrm{flat}}(y)\) (solid curve), the numerical fit (dashed curve), and the ray-tracing simulation (dotted curve). Note that the speckle structures in the experimental beam profiles are caused by the DCM crystal surface finish, which can be removed mainly by the normalization, as shown in (d). The simulation noise is dominated by statistics due to limited number of rays.

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