Table 1 Summary of experimentally extracted source properties.

From: A spatial beam property analyzer based on dispersive crystal diffraction for low-emittance X-ray light sources

Skew quadrupole current \(A_{m}\)

Source size \(\sigma _{y}\)

Source divergence \(\sigma _{y'}\) (µrad)

Beam position \(y_{\mathrm{beam}}\) (µm)

Source position \(y_{s}\) (µm)

Source angle \(y'_{s}\) (µrad)

0.454

12.31 ± 0.59

28.15 ± 0.03

0 ± 0.97

0 ± 1.40

0 ± 0.13

0.244

12.95 ± 0.34

28.39 ± 0.03

− 2.05 ± 1.02

5.06 ± 0.48

− 0.44 ± 0.10

0.024

14.31 ± 0.87

28.50 ± 0.02

− 0.49 ± 0.73

10.82 ± 2.38

− 0.71 ± 0.15

- 0.516

17.96 ± 0.42

28.70 ± 0.03

0.14 ± 1.92

20.19 ± 1.06

− 1.25 ± 0.18

  1. The measurement at 0.454 A current was taken as the reference for the relative source positions and angles.