Table 1 Verification structures.
| Â | Case study | ||
|---|---|---|---|
Structure I | Structure II | Structure III* | |
Substrate | εr = 3.5 | εr = 3.5 | εr = 3.5 |
h = 0.76 mm | h = 0.76 mm | h = 0.76 mm | |
Design parameters | x = [l1 l2 l3 w1 w2 w3]T | x = [l1 l2 l3 d w w1]T | x = [l1.1 l1.2 w1.1 w1.2 w1.0 l2.1 l2.2 w2.1 w2.2 w2.0]T |
Other parameters | l0 = 30, w0 = 3, s0 = 0.15, o = 5 | d1 = d +|w − w1|, d = 1.0, w0 = 1.7, and l0 = 15 | win = 1.7, wout = 0.4 |
Design specifications | Minimize reflection coefficient |S11| at two operating frequencies, 2.5 GHz and 4.8 GHz | Ensure 3 dB power split, |S31| −|S21|= 3 dB, at the operating frequency f0 = 1 GHz, and minimize max{|S11|,|S41|} at f0 | Minimize the maximum in-band reflection coefficient |S11| within the range 1.8 GHz to 4.0 GHz |
LPW | 25 | 15 | 30 |
Simulation time# | 60Â s | 160Â s | 120Â s |
Parameter space | l = [15 5 5 0.2 1.5 0.5]T | l = [1.0 5.0 10.0 0.2 0.5 0.2]T | l = [2.0 0.1 0.5 0.1 0.2 2.0 0.1 0.1 0.1 0.2]T |
u = [50 15 30 0.6 5.0 5.0]T | u = [6.0 15.0 25.0 1.2 1.5 1.2]T | u = [5.5 0.5 1.1 0.8 1.1 4.5 1.0 0.6 0.6 1.3]T | |