Figure 1 | Scientific Reports

Figure 1

From: Crystallinity in periodic nanostructure surface on Si substrates induced by near- and mid-infrared femtosecond laser irradiation

Figure 1

Schematic diagram for the XRD measurement setup. We performed XRD analysis using high-energy x-rays (30 keV). Transmitted x-ray diffraction light was detected by two-dimensional detector. The dotted arrows show the direction of the x-rays and the solid arrows represent the crystal orientation of Si substrate. The measurement position was adjusted by moving a stage under the Si substrate.

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