Figure 6
From: Using machine learning with optical profilometry for GaN wafer screening
Gaussian fit of accuracy vs number of counts calculated from 1000 training iterations where 80% of the data was used to train the model, and the other 20% was used to test the model chosen at random. (A) The accuracy if all data is considered. (B) The accuracy of only the devices predicted to fail. (C) The accuracy of only the devices predicted to pass.
