Figure 3
From: SPLIT-PIN software enabling confocal and super-resolution imaging with a virtually closed pinhole
Removal of out-of-focus background in STED microscopy by SPLIT-PIN. (a) STED images acquired sequentially at different pinhole size. The images represent transcription foci in fixed U937-PR9 cells. b) SPLIT-PIN image (left) and isolated out-of-focus signal (right). Scale bar 1um. (c) Line profile corresponding to the dashed line in (b). (d) Quantification of Resolution (R), Brightness (B) and Noise (N) parameters for the SPLIT-PIN and 0.5 A.U. images shown in (a, b) using the QuICS algorithm.
