Figure 2
From: Self-absorption correction on 2D X-ray fluorescence maps
Simulation on self-absorption correction. (a) Zr-Hf binary cubical sample and XRF mapping setup. Composition varies in the x–y plane but is constant along the z-direction. X-ray beam illuminates the sample in the z-direction, and a raster scan is performed in the x–y plane. The cube has a size of 100 × 100 × 100 voxels with a 50 nm voxel size. (b) simulated 2D XRF image of Zr (c) XRF image of Zr after the absorption correction. (d) ground truth of Zr XRF image (e) fraction difference of Zr, calculated as: |correction-ground truth|/ground truth. (f) histogram of (e). (g) simulated 2D XRF image of Hf. (h) XRF image of Hf after the absorption correction. (i) ground truth of XRF of Hf XRF image. (j) fraction difference of Hf. (k) histogram of (j).
