Figure 4
From: Self-absorption correction on 2D X-ray fluorescence maps
Element distributions in sensitized stainless steel. (a) Cr XRF image before correction. (b) Cr XRF image after correction, (c) Cr concentration (i.e. weight percentage) map before correction, (d) Cr concentration map after correction. Two arrows point to the localized Cr enrichment clusters along the grain boundaries (e) histogram of the Cr concentration map before and after correction. (f) Ni XRF image before correction, (g) Ni XRF image after correction, (h) Ni concentration map before correction, (i) Ni concentration map after correction, (j) histogram of the Ni concentration map before and after correction. (k) Fe XRF image before correction, (l) Fe XRF image after correction, (m) Fe concentration map before correction, (n) Fe concentration map after correction. Two arrows point to the same regions shown in n, (o) histogram of the Fe concentration map before and after correction. A fractional concentration of an element, for example, Cr, is obtained by Cr/(Cr + Ni + Fe) using their weight percentages. All images share the same scalebar.
