Figure 2

Rietveld refinement of pristine ZnO(P63mc). The XRD data is represented by open circles, while the lines depict theoretical fits to the observed X-ray data. The vertical bars indicate the Bragg reflections corresponding to the planes. The difference pattern between observed data and theoretical fit is presented at bottom. The inset features: (a) an enlarged view of the pristine ZnO(101) peak, and (b) the refined parameters utilized for the determination of electronic structure of pristine sample of ZnO.