Figure 7
From: Interface microstructure effects on dynamic failure behavior of layered Cu/Ta microstructures
Comparison of stress–strain plots for X[1̅1̅1], Y[11̅0], and Z[112] loading orientations in (a) KS112 interface system, and (b) OT1 interface system. Comparison of stress–strain plot for un-deformed and pre-deformed (c) KS112 and (d) OT1 interfaces loaded in the direction perpendicular to the interface. Blue and orange dashed vertical lines represent the void nucleation and peak number of voids points, respectively. Here, blue and orange dashed vertical lines at points A and B represent the void nucleation and peak number of voids points, respectively.
