Table 1 Characteristics and labeling of the synthetic SiO2 glasses studied.

From: Probing densified silica glass structure by molecular oxygen and E’ center formation under electron irradiation

Type of SiO2 material

Sample label

Densification pressure (GPa)

Densification temperature (° C)

Pre-irrad. dose

CL meas. dose

Initial density (g/cm3)

Final density (g/cm3)

Suprasil F300

P0T0

0

0

0

62MGy

2.20

2.204

P5T350

5

350

0

56MGy

2.422

2.41

P4T450

4

450

0

100MGy

2.294

2.344

P5T1000

5

1000

0

199MGy

2.612

2.5817

KUVI

O-deficient

0

0

0

186MGy

2.217

2.202

Suprasil W

O-rich

0

0

0

104MGy

2.214

 

Suprasil F300

P0T0 11GGy

0

0

11GGy

 + 103MGy

2.257

2.256

P5T1000 11GGy

5

1000

11GGy

 + 94MGy

2.282

2.288

α-quartz

α-quartz

–

–

1 × 1019n/cm2

 

2.65

 
  1. Initial and final densities were measured before and after the irradiation dose accumulated during the cathodoluminescence (CL) measurement. Neutron-irradiated synthetic α-quartz crystal was used in a single experiment to compare O2 CL band shapes in glass and crystal.
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