Table 3 Using LLF, run length profiles of Bayesian CC for P distribution with \(\lambda\) = 0.10.

From: Monitoring of manufacturing process using bayesian EWMA control chart under ranked based sampling designs

Shift

Bayes-EWMA SRS

Bayes-EWMA RSS

Bayes-EWMA MRSS

Bayes-EWMA ERSS

ARL

SDRL

ARL

SDRL

ARL

SDRL

ARL

SDRL

L = 2.7047

L = 2.7331

L = 2.7245

L = 2.7142

0.00

370.63

368.13

369.39

368.11

371.09

367.67

371.11

368.77

0.20

123.94

115.00

54.97

49.58

44.18

38.65

60.39

54.44

0.40

41.33

32.49

15.51

11.25

12.49

8.72

17.55

13.35

0.60

20.95

13.50

7.65

4.99

6.31

3.93

8.58

5.74

0.75

14.79

8.35

5.35

3.24

4.38

2.57

5.88

3.62

0.80

13.38

7.17

4.80

2.81

3.96

2.27

5.30

3.27

1.00

9.79

4.49

3.33

1.85

2.82

1.52

3.71

2.13

2.00

4.18

1.20

1.30

0.51

1.16

0.38

1.39

0.57

2.50

3.31

0.84

1.07

0.26

1.02

0.15

1.11

0.33

4.00

2.13

0.383

1

0

1

0

1

0