Figure 8
Illustration of the time-dependent chip-temperature measurement based on isothermal current–voltage (I–V) characteristics, using the example of a 1200 V Schottky barrier diode and 120 A peak surge current.
Figure 8 | Scientific Reports
Illustration of the time-dependent chip-temperature measurement based on isothermal current–voltage (I–V) characteristics, using the example of a 1200 V Schottky barrier diode and 120 A peak surge current.
