Figure 9
(a) LEED pattern of the cleaved Sb(111) surface. Ep = 112 eV. (b) STM image of 7.5 × 7.5 nm2 with atomic resolution measured with the Pt-Ir tip at T = 300 K, Ubias = + 0.01 V, Itun = 70 pA. Insert: The Fast Fourier transform of the STM image. (c,d) Blue and red profiles of corresponding cross-sections in the STM image in (b).
