Figure 5
From: Enhancing SiGeSn nanocrystals SWIR photosensing by high passivation in nanocrystalline HfO2 matrix
(a) HRTEM image of a black contrast crystallite showing a 25 nm HfO2 crystallite, in contact with a smaller (10 nm) crystallite of SiGeSn, in near [110] orientation; (b) HRTEM image of a HfO2 orthorhombic crystallite.
