Figure 4
From: Strain-dependent grain boundary properties of n-type germanium layers
Crystal properties of the Ge layers. Inverse pole figure images from EBSD analyses for the samples with (a) SiO2, (b) Si, (c) CaF2, and (d) PI substrate. The color in crystal orientation maps indicates the crystal orientation (refer to legend in the inset). Grain boundaries are shown as black lines. (e) RMS, average grain size, and twin boundary density as a function of Δα.
