Figure 4
From: Fatigue and failure mode analyses of glass infiltrated 5Y-PSZ bonded onto dentin analogues
Scanning electron microscopy (SEM) images of the Zinf-tens group. Micrograph of the defective origin of the fracture (white circle), 1-infiltrated glass, 2-smaller cubic grains caused by glass infiltration, 3-cubic zirconia, highlighting the distinct failure mode pattern compared to the other groups, with the failure origin within the material, magnification 1000×.
