Figure 6

Photographs and SEM images of the SS submillimeter channel devices sintered and joined (a) at 1130 °C for 6 h, (b) at 1135 °C for 6 h, (c) at 1135 °C for 12 h, (d) at 1140 °C for 6 h, (e) at 1150 °C for 6 h; micro-CT images showing the planar cross-section of the submillimeter channel devices sintered and joined (f) at 1135 °C for 12 h and (g) 1150 °C for 6 h. Scale bar: 5 mm in photographs and 0.5 mm in SEM images, and 4 mm in micro-CT images.