Table 3 Faster R-CNN performance on the DeepPCB dataset.

From: Attentive context and semantic enhancement mechanism for printed circuit board defect detection with two-stage and multi-stage object detectors

Method

Input

mAP

\(AP_{s}\)

\(AP_{m}\)

mAR

\(AR_{s}\)

\(AR_{m}\)

Faster R-CNN w/ Resnet50 (baseline1a)

\(640 \times 640\)

74.4

74.4

74.8

79.9

79.4

80

Faster R-CNN w/ Resnet50 (baseline1b)

\(800 \times 800\)

76.3

75.8

76.9

82.0

82.1

80.9

Faster R-CNN w/ Resnet101 (baseline2a)

\(640 \times 640\)

73.8

72.8

74.8

79.9

79.2

80.0

Faster R-CNN w/ Resnet101 (baseline2b)

\(800 \times 800\)

76.2

76.0

77.0

82.4

83.0

82.2

Faster R-CNN w/Resnet50+ACASEM

\(640 \times 640\)

76.7

76.9

77.2

82.7

83.5

82.2

Faster R-CNN w/Resnet50+ACASEM

\(800 \times 800\)

78.1

78.9

78.0

83.7

84.4

83.5

Faster R-CNN w/Resnet101+ACASEM

\(640 \times 640\)

75.8

75.4

76.8

81.9

81.6

82

Faster R-CNN w/Resnet101+ACASEM

\(800 \times 800\)

77.1

78.1

77.4

83.5

84.1

83.2

  1. Significant values are in bold.