Table 6 Faster R-CNN performance on the Augmented PCB Defect dataset.

From: Attentive context and semantic enhancement mechanism for printed circuit board defect detection with two-stage and multi-stage object detectors

Method

mAP

\(D_1\)

\(D_2\)

\(D_3\)

\(D_4\)

\(D_5\)

\(D_6\)

Faster R-CNN w/Resnet50 (baseline7a)

97.6

96.4

97.3

97.4

97.1

98

99.3

Faster R-CNN w/Resnet101 (baseline7b)

97.9

98

98

97.6

96.5

97.8

99.2

Faster R-CNN w/Resnet50+ ACASEM

98.6

98.5

98.2

98.2

98

99.2

99.2

Faster R-CNN w/Resnet 101+ ACASEM

98.5

98.9

97.6

98.3

97.8

99

99.3

  1. \(D_1\) stands for open-circuit, \(D_2\) : short, \(D_3\) : mousebite, \(D_4\) : spur, \(D_5\) : spurious_copper and \(D_6\) : missing_hole defects.
  2. Significant values are in bold.