Figure 3

AFM analysis of untreated (a–c) and treated (d-f) 2D-MoS2 nanoflakes deposited on a Si/SiO2 substrate. In particular, panel (a, d) report typical phase maps, while panel (b, d) report the corresponding height maps. Finally, panel (c, f) report the height profiles as read along the white line highlighted in (b) and (e), respectively.