Fig. 5
From: Alloying effects on deformation induced microstructure evolution in copper
Comparison of dislocation structures in Cu and Cu1\(\%\)Pb at different strain levels. Bright field (BF) TEM micrographs of Cu deformed to (a) 5\(\%\) and (b) 20\(\%\) strain show an increase in dislocation density with strain. In contrast, BF TEM micrographs of Cu1\(\%\)Pb at (c) 5\(\%\) and (d) 20\(\%\) strain indicate a higher dislocation density than that in Cu at equivalent strain levels. All TEM micrographs were captured under two-beam conditions with \(\hbox {g}_{020}\) strongly excited, as indicated by the orange arrows in the lower right corners of the micrographs.
