Fig. 4
From: Fabrication and X-ray microtomography of sandwich-structured PEEK implants for skull defect repair
Chemical characterization of the PEEK implant. (a) XRD pattern; (b) FTIR spectra.
Fig. 4 | Scientific Reports
From: Fabrication and X-ray microtomography of sandwich-structured PEEK implants for skull defect repair
Chemical characterization of the PEEK implant. (a) XRD pattern; (b) FTIR spectra.
