Fig. 2
Relative intensities of various Bragg peaks of a 50-nm thick Si film after laser-excitation with a fluence below the damage threshold are shown as a function of time. The data points in the graph correspond to experimental results, while the lines depict values calculated from our MD simulations. Solid lines represent calculations that take into account both the excited PES and EPC, whereas dashed lines pertain to simulations considering only the EPC. The experimental values are extracted from Fig. 4 of Reference28.
