Fig. 3
From: Scalable synthesis of millimeter-long single crystal Ta2Ni3Se8 Van der Waals nanowires
Transmission‑electron‑microscopy analysis of ultralong Ta₂Ni₃Se₈ nanowires. (a) High‑resolution TEM image of a representative nanowire. Lattice fringes with an interplanar spacing of 0.62 nm are clearly resolved perpendicular to the chain‑growth direction. Inset: selected‑area electron‑diffraction (SAED) pattern indexed to monoclinic Ta₂Ni₃Se₈ (scale bar = 2 nm−1). (b) The low-magnification survey TEM image displays a sparse network of nanowires. The nanowire outlined by the red dashed box was chosen for detailed crystallographic examination (scale bar = 2 μm). (c) Bright‑field TEM image of the selected nanowire. SAED patterns were recorded at five positions (boxes 1–5) along its length; the identical spot patterns (insets, scale bars = 2 nm−1 demonstrate single‑crystallinity and a uniform crystal orientation throughout the entire wire.
