Fig. 7
From: Mapping residual stresses in AlSi10Mg alloy fabricated by powder bed fusion-laser beam method

DF-STEM imaging analysis of as-built AlSi10Mg sample. (a) and (d): DF-STEM images showcasing the microstructure observed from specimens prepared in building and scanning orientations, respectively. (b) and (e): higher magnification DF-STEM images of specimens from building and scanning orientations. The presented images exhibit a contrast in the Si eutectic regions that possibly emanate due to a gradient in Si concentration. (c) and (f): Electron diffraction pattern of the specimen from building and scanning orientations, respectively. The acquired patterns confirm the tilting of the specimens along \(\:{\left[001\right]}_{Al}\) zone axis.