Table 6 Evaluating the stability of the proposed gates with varying temperature (k) ranges.
ASDB Gates | Temperature (k) ranges A | Occurrence (%) | Temperature(k) ranges B | Occurrence (%) | Temperature(k) ranges C | Occurrence (%) | Temperature(k) ranges D | Occurrence (%) | Temperature(k) ranges E | Occurrence (%) | |||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
AND | 2 | 500 | 97 | 500 | 600 | 48 | 600 | 700 | 34 | 700 | 800 | 13 | 800 | 1000 | 2 |
NAND | 2 | 500 | 89 | 500 | 600 | 43 | 600 | 700 | 34 | 700 | 800 | 9 | 800 | 1000 | 0.36 |
OR | 2 | 500 | 99 | 500 | 600 | 46 | 600 | 700 | 28 | 700 | 800 | 9 | 800 | 1000 | 1 |
NOR | 2 | 500 | 82 | 500 | 600 | 32 | 600 | 700 | 23 | 700 | 800 | 9 | 800 | 1000 | 1 |
XOR | 2 | 500 | 95 | 500 | 600 | 38 | 600 | 700 | 19 | 700 | 800 | 8 | 800 | 1000 | 4 |
XNOR | 2 | 500 | 97 | 500 | 600 | 46 | 600 | 700 | 16 | 700 | 800 | 6 | 800 | 1000 | 7 |