Fig. 1
From: X-ray near-field multi-slice ptychography for in-situ imaging
Schematic of the experimental setup. The X-ray beam is focused by a set of two MLLs to a focal spot of 30 nm (h) \(\times\) 24 nm (v) (FWHM) in horizontal and vertical direction, respectively. A pinhole between the lenses and the focal spot acts as an order sorting aperture and cleans the beam. The sample is positioned at a distance between 0.63 mm and 3.00 mm downstream of the focus and scanned laterally across the beam. For each scan point, a diffraction pattern is recorded on a photon-counting detector at a distance of 3290 mm behind the sample. Image is not to scale.
