Table 20 Sensitivity to stress-threshold design (8 × 8, 10% faults).
Design | Thresholds (Low/Mod/Sev) | Throughput | Delay |
|---|---|---|---|
Baseline (3-level) | < 0.47 / 0.47–0.87 / >0.87 | 5.08 | 41 |
3-level (tighter mid/high) | < 0.45 / 0.45–0.85 / >0.85 | 5.05 | 41 |
3-level (more conservative) | < 0.50 / 0.50–0.90 / >0.90 | 5.02 | 42 |
5-level (finer bins) | < 0.25 / <0.50 / <0.75 / <0.90 / ≥0.90 | 5.10 | 41 |
Continuous (EWMA, α = 0.2) | n/a (continuous sts_t) | 5.12 | 40 |