Fig. 6
ER and IP tomograms before (T₀) and after (T₉) stabilization in the three test plots: (a–b) Control (untreated), (c–d) WOS 5% (powder), and (e–f) WOS 5% (granular). Panels (a), (c), and (e) show resistivity distributions, while panels (b), (d), and (f) present chargeability distributions. The resistivity ranges are 50–5,000 Ω·m for the control plot, 10–300 Ω·m for the powdered WOS plot, and 50–900 Ω·m for the granular WOS plot. The corresponding chargeability ranges are 1–35 mV/V, 1–12 mV/V, and 5–25 mV/V, respectively. Color scales were independently optimized within each plot to visualize temporal changes between T₀ and T₉ rather than to standardize values across plots. Measurement depth extends from the surface to 90 cm, with horizontal lines marking the 30 cm stabilization layer in the amended plots.
