Fig. 1 | Scientific Reports

Fig. 1

From: Nonnegative matrix factorization incorporating domain specific constraints for four dimensional scanning transmission electron microscopy

Fig. 1

Schematic drawings of Four-dimensional scanning transmission electron microscopy (4D-STEM) and various factorizations. Factorized results include the first and the second diffractions and corresponding maps. Fourier transforms (FTs) of the maps are also shown. a Schematic of 4D-STEM, b Principal component analysis (PCA) of simulated 4D-STEM data. Blue arrows indicate artifacts of negative intensities. Dotted lines in the FTs of the maps indicate the resolution limits, and their outer parts represent high-frequency noise. c Primitive nonnegative matrix factorization (NMF). White arrows indicate artifacts of downward-convex peaks. d NMF with domain-specific constraints. These results do not show artifacts, such as downward-convex peaks in the diffractions or high-frequency noise in the maps.

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