Fig. 9

Normalized voltage versus normalized time functions for different bins of avalanche area, \(\:S\), obtained from AE measurements during temperature induced martensitic transformation with \(\:\varphi\:=0.75\) in Ni₄₅Fe₁₈Ga₂₇Co₆ shape memory single crystal²¹. The insert shows the same plots without points belonging to the two smallest S interval (between 0.08 and 0.12 \(\:\mu\:Vs\) as well as between 0.15 and 0.25 \(\:\mu\:Vs\)). It can be seen that the curves are very well scaled together in the first part (up to about \(\:\frac{t}{{A}^{1-\varphi\:}}=1.5\:\frac{s}{{V}^{1-\varphi\:}}\)) while they show some fluctuations in tail region for larger values of the reduced time, which can be related to overlapping of sub-avalanches.