Table 1 System suitability parameters of the developed thin layer chromatographic-densitometric method.
Parameters | VON | ASP | Acceptance criteria |
|---|---|---|---|
Retardation factor (RF) | 0.45 ± 0.02 | 0.75 ± 0.02 | - |
Tailing factor (T) | 1.0 | 0.98 | ~ 1.0 |
Capacity factor (K˜) | 1.04 | 2 | 1–10 |
Selectivity factor (α) | 1.923 | > 1.0 | |
Resolution (Rs) | 1.9606 | > 1.5 | |