Table 1 Represents the employed techniques for characterizing the structure and their specifications.
Instrument | Model | Operating conditions |
|---|---|---|
Scanning electron microscope (SEM) | JSM-6360LA, JSM-5300JEOL, JEOL-JFC-1100E Ltd., USA | 25KV, 25000X |
EDX | JSM-6360LA, JSM-5300JEOL, JEOL-JFC-1100E Ltd., USA | 25KV, 25000X |
UPLC-MS | Waters ACQUITY UPLC, ESI-MS-XEVO TQD triple quadruple instrument. Waters Corporation, MA01757 U.S.A. | ACQUITY UPLC - BEH C18 1.7 μm − 2.1 × 50 mm Column. Flow rate: 0.2 mL\min |
XRD | X’Pert³ Powder, Netherland. | X-ray tube target: Cu voltage: 40.0 (kV), scan speed = 12.0000 (deg/min) |
Thermal analysis | Perkin-Elmer TGA7 Thermobalance | temperature heating range is 20–1000 °C, heating rate is 10 °C min−1 |