Fig. 5 | Scientific Reports

Fig. 5

From: Fourier-plane wavefront and SLM aberration characterization via iterative scanning of beam deflector segments

Fig. 5

Point shifting process for the patch (1, 1) in an example measurement. The colors were modified in post-processing. (a) ROI with the reference point. (b)-(d) ROI with the observed point shown in green and the reference point superimposed in red: (b) visible after the first iteration when \(\tilde{\textbf{g}}_{11} = (0, 0)\), (c) after the second iteration (step 2(b)), and (d) after the third (step 2(c)). The yellow area indicates the overlap between the two spots. The exact values of the used gradients \(\tilde{\textbf{g}}_{11}\) in units of rad/patch and the observed separation \(\delta \textbf{x}_{11}\) in units of rad/pixel are showed at the bottom of the images.

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