Fig. 8
(a) Phase correction pattern provided by the SLM manufacturer, obtained using an interferometer. (b), (c) Phase correction pattern and measured amplitude obtained using the proposed method. (d) Unwrapped phase of the difference between phases in (a) and (b). (e)-(g) Reconstructed images generated without any correction, using the phase from (a), and using the phase from (b) and amplitude from (d), respectively. (h) and (i) Observed images using the phase from (a) observed in the two experimental configurations examined in “Results”.
